Pulsed measurement method for characterizing chemical solutions using nanowire FETs

M Mescher, B Marcelis, M de Wild, JH Klootwijk

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings IEEE International Conference on Microelectronics Test Structures
Editors	s.n.
Place of Publication	Hiroshima, Japan
Publisher	s.n.
Pages	44-47
Number of pages	4
Publication status	Published - 2010
Event	ICMTS 2010 - Hiroshima, Japan Duration: 22 May 2010 → …

Name
Publisher	s.n.

Other	ICMTS 2010
Period	22/05/10 → …

Keywords

@inproceedings{699139dc25a24cbd98200a6b4884ae18,

title = "Pulsed measurement method for characterizing chemical solutions using nanowire FETs",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "M Mescher and B Marcelis and {de Wild}, M and JH Klootwijk",

year = "2010",

language = "English",

publisher = "s.n.",

pages = "44--47",

editor = "s.n.",

booktitle = "Proceedings IEEE International Conference on Microelectronics Test Structures",

note = "ICMTS 2010 ; Conference date: 22-05-2010",

}

Pulsed measurement method for characterizing chemical solutions using nanowire FETs. / Mescher, M; Marcelis, B; de Wild, M et al.
Proceedings IEEE International Conference on Microelectronics Test Structures. ed. / s.n. Hiroshima, Japan: s.n., 2010. p. 44-47.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Pulsed measurement method for characterizing chemical solutions using nanowire FETs

AU - Mescher, M

AU - Marcelis, B

AU - de Wild, M

AU - Klootwijk, JH

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 44

EP - 47

BT - Proceedings IEEE International Conference on Microelectronics Test Structures

A2 - s.n., null

PB - s.n.

CY - Hiroshima, Japan

T2 - ICMTS 2010

Y2 - 22 May 2010

ER -