Pulsed measurement method for characterizing chemical solutions using nanowire FETs

M Mescher, B Marcelis, M de Wild, JH Klootwijk

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings IEEE International Conference on Microelectronics Test Structures
Editors s.n.
Place of PublicationHiroshima, Japan
Publishers.n.
Pages44-47
Number of pages4
Publication statusPublished - 2010
EventICMTS 2010 - Hiroshima, Japan
Duration: 22 May 2010 → …

Publication series

Name
Publishers.n.

Other

OtherICMTS 2010
Period22/05/10 → …

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this

Mescher, M., Marcelis, B., de Wild, M., & Klootwijk, JH. (2010). Pulsed measurement method for characterizing chemical solutions using nanowire FETs. In s.n. (Ed.), Proceedings IEEE International Conference on Microelectronics Test Structures (pp. 44-47). s.n..