Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques

C Hugenschmidt; A Bauer; P. Boni; H. Ceeh; SWH Eijt; T Gigl; C. Pfleiderer; C. Piochacz; A. Neubauer; M. Reiner; H Schut; J. Weber

doi:10.1007/s00339-015-9058-7

Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques

C Hugenschmidt, A Bauer, P. Boni, H. Ceeh, SWH Eijt, T Gigl, C. Pfleiderer, C. Piochacz, A. Neubauer, M. Reiner, H Schut, J. Weber

Research output: Contribution to journal › Article › Scientific › peer-review

7 Citations (Scopus)

Original language	English
Pages (from-to)	997-1002
Number of pages	6
Journal	Applied Physics A: materials science & processing
Volume	119
DOIs	https://doi.org/10.1007/s00339-015-9058-7
Publication status	Published - 2015

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10.1007/s00339-015-9058-7

Cite this

@article{0dda55d4c38348cebf2f6eb78a142e37,

title = "Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques",

author = "C Hugenschmidt and A Bauer and P. Boni and H. Ceeh and SWH Eijt and T Gigl and C. Pfleiderer and C. Piochacz and A. Neubauer and M. Reiner and H Schut and J. Weber",

year = "2015",

doi = "10.1007/s00339-015-9058-7",

language = "English",

volume = "119",

pages = "997--1002",

journal = "Applied Physics A: materials science & processing",

issn = "0947-8396",

publisher = "Springer",

}

TY - JOUR

T1 - Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques

AU - Hugenschmidt, C

AU - Bauer, A

AU - Boni, P.

AU - Ceeh, H.

AU - Eijt, SWH

AU - Gigl, T

AU - Pfleiderer, C.

AU - Piochacz, C.

AU - Neubauer, A.

AU - Reiner, M.

AU - Schut, H

AU - Weber, J.

PY - 2015

Y1 - 2015

U2 - 10.1007/s00339-015-9058-7

DO - 10.1007/s00339-015-9058-7

M3 - Article

SN - 0947-8396

VL - 119

SP - 997

EP - 1002

JO - Applied Physics A: materials science & processing

JF - Applied Physics A: materials science & processing

ER -