Original language | English |
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Pages (from-to) | 997-1002 |
Number of pages | 6 |
Journal | Applied Physics A: materials science & processing |
Volume | 119 |
DOIs | |
Publication status | Published - 2015 |
Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques
C Hugenschmidt, A Bauer, P. Boni, H. Ceeh, SWH Eijt, T Gigl, C. Pfleiderer, C. Piochacz, A. Neubauer, M. Reiner, H Schut, J. Weber
Research output: Contribution to journal › Article › Scientific › peer-review
7
Citations
(Scopus)