Quality of Islands Grown from a Grid of Grain Filters in Excimer-Laser Crystallized Thin Silicon Films

PC van der Wilt; BD van Dijk; GJ Bertens; R Ishihara

Quality of Islands Grown from a Grid of Grain Filters in Excimer-Laser Crystallized Thin Silicon Films

PC van der Wilt
, BD van Dijk
, GJ Bertens
, R Ishihara

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	SAFE-ProRISC-SeSens 2001: proceedings.
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	53-53
Number of pages	1
ISBN (Print)	90-73461-28-6
Publication status	Published - 2001
Event	Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology, Veldhoven - Utrecht Duration: 28 Nov 2001 → 30 Nov 2001

Publication series

Name
Publisher	STW technology foundation

Conference

Conference	Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology, Veldhoven
Period	28/11/01 → 30/11/01

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{b248dac8a98445a286f485f876fd7b3b,

title = "Quality of Islands Grown from a Grid of Grain Filters in Excimer-Laser Crystallized Thin Silicon Films",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "\{van der Wilt\}, PC and \{van Dijk\}, BD and GJ Bertens and R Ishihara",

year = "2001",

language = "Undefined/Unknown",

isbn = "90-73461-28-6",

publisher = "STW Technology Foundation",

pages = "53--53",

booktitle = "SAFE-ProRISC-SeSens 2001: proceedings.",

note = "Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology, Veldhoven ; Conference date: 28-11-2001 Through 30-11-2001",

}

van der Wilt, PC, van Dijk, BD, Bertens, GJ & Ishihara, R 2001, Quality of Islands Grown from a Grid of Grain Filters in Excimer-Laser Crystallized Thin Silicon Films. in SAFE-ProRISC-SeSens 2001: proceedings.. STW Technology Foundation, Utrecht, pp. 53-53, Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology, Veldhoven, 28/11/01.

TY - GEN

T1 - Quality of Islands Grown from a Grid of Grain Filters in Excimer-Laser Crystallized Thin Silicon Films

AU - van der Wilt, PC

AU - van Dijk, BD

AU - Bertens, GJ

AU - Ishihara, R

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 90-73461-28-6

SP - 53

EP - 53

BT - SAFE-ProRISC-SeSens 2001: proceedings.

PB - STW Technology Foundation

CY - Utrecht

T2 - Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology, Veldhoven

Y2 - 28 November 2001 through 30 November 2001

ER -