Quantification of Valleys of Randomly Textured Substrates as a Function of Opening Angle: Correlation to the Defect Density in Intrinsic nc-Si:H

Doyun Kim, Simon Hänni, Jan-Willem Schüttauf, Rene van Swaaij, Miro Zeman

Research output: Contribution to journal › Article › Scientific › peer-review

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Material Science