Quantifying amplitude reduction mechanism in Tapping Mode Atomic Force Microscopy

A. Keyvani, H. Sadeghian, Hans Goosen, Fred van Keulen

Research output: Contribution to conference › Abstract › Scientific

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Original language	English
Pages	55-56
Publication status	Published - 2016
Event	13th International Workshop on Nanomechanical Sensing - Delft, Netherlands Duration: 22 Jun 2016 → 24 Jun 2016

Workshop	13th International Workshop on Nanomechanical Sensing
Abbreviated title	NMC 2016
Country/Territory	Netherlands
City	Delft
Period	22/06/16 → 24/06/16

Access to Document

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title = "Quantifying amplitude reduction mechanism in Tapping Mode Atomic Force Microscopy",

author = "A. Keyvani and H. Sadeghian and Hans Goosen and {van Keulen}, Fred",

year = "2016",

language = "English",

pages = "55--56",

note = "13th International Workshop on Nanomechanical Sensing, NMC 2016 ; Conference date: 22-06-2016 Through 24-06-2016",

}

TY - CONF

T1 - Quantifying amplitude reduction mechanism in Tapping Mode Atomic Force Microscopy

AU - Keyvani, A.

AU - Sadeghian, H.

AU - Goosen, Hans

AU - van Keulen, Fred

PY - 2016

Y1 - 2016

UR - http://resolver.tudelft.nl/uuid:13dc6234-5d79-4ec0-bd74-caff0dd67aa1

M3 - Abstract

SP - 55

EP - 56

T2 - 13th International Workshop on Nanomechanical Sensing

Y2 - 22 June 2016 through 24 June 2016

ER -