Quantitative AFM-SECM analysis with conductive cantilevers

PLTM Frederix; PD Bosshart; M Chami; T Akiyama; NF de Rooij; U Staufer; A Engel

Quantitative AFM-SECM analysis with conductive cantilevers

PLTM Frederix, PD Bosshart, M Chami, T Akiyama, NF de Rooij, U Staufer, A Engel

Micro and Nano Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Annual Meeting of the Swiss Physical Society (SPS) 2008
Editors	s.n.
Place of Publication	Geneve
Publisher	s.n.
Pages	1-1
Number of pages	1
Publication status	Published - 2008
Event	Annual Meeting of the Swiss Physical Society (SPS) 2008 - Geneve Duration: 26 Mar 2008 → 27 Mar 2008

Publication series

Name
Publisher	s.n.

Conference

Conference	Annual Meeting of the Swiss Physical Society (SPS) 2008
Period	26/03/08 → 27/03/08

Bibliographical note

NEO

Keywords

conference contrib. refereed
Geen BTA classificatie

Cite this

@inproceedings{973f5e2b1dca4324a9c3b5a95cfceff8,

title = "Quantitative AFM-SECM analysis with conductive cantilevers",

keywords = "conference contrib. refereed, Geen BTA classificatie",

author = "PLTM Frederix and PD Bosshart and M Chami and T Akiyama and {de Rooij}, NF and U Staufer and A Engel",

note = "NEO; Annual Meeting of the Swiss Physical Society (SPS) 2008 ; Conference date: 26-03-2008 Through 27-03-2008",

year = "2008",

language = "English",

publisher = "s.n.",

pages = "1--1",

editor = "s.n.",

booktitle = "Annual Meeting of the Swiss Physical Society (SPS) 2008",

}

TY - GEN

T1 - Quantitative AFM-SECM analysis with conductive cantilevers

AU - Frederix, PLTM

AU - Bosshart, PD

AU - Chami, M

AU - Akiyama, T

AU - de Rooij, NF

AU - Staufer, U

AU - Engel, A

N1 - NEO

PY - 2008

Y1 - 2008

KW - conference contrib. refereed

KW - Geen BTA classificatie

M3 - Conference contribution

SP - 1

EP - 1

BT - Annual Meeting of the Swiss Physical Society (SPS) 2008

A2 - s.n., null

PB - s.n.

CY - Geneve

T2 - Annual Meeting of the Swiss Physical Society (SPS) 2008

Y2 - 26 March 2008 through 27 March 2008

ER -