Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: Determination of the thickness and composition of thin iron oxide films.

PCJ Graat; MAJ Somers

Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: Determination of the thickness and composition of thin iron oxide films.

PCJ Graat, MAJ Somers

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	773-782
Number of pages	10
Journal	Surface and Interface Analysis
Volume	26
Issue number	11
Publication status	Published - 1998

Cite this

@article{def97d8a0ee447c6969a0041f01965e5,

title = "Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: Determination of the thickness and composition of thin iron oxide films.",

author = "PCJ Graat and MAJ Somers",

year = "1998",

language = "Undefined/Unknown",

volume = "26",

pages = "773--782",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley & Sons",

number = "11",

}