Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: Determination of the thickness and composition of thin iron oxide films.

PCJ Graat, MAJ Somers

    Research output: Contribution to journalArticleScientificpeer-review

    89 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)773-782
    Number of pages10
    JournalSurface and Interface Analysis
    Volume26
    Issue number11
    Publication statusPublished - 1998

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