Quantitative measurement of tip-sample interaction forces in tapping mode atomic force microscopy

Selman Tamer, Hamed Sadeghian Marnani, Sasan Keyvani Janbahan, Hans Goosen, Fred van Keulen

Research output: Contribution to conferenceAbstractScientific

17 Downloads (Pure)
Original languageEnglish
Pages199-200
Publication statusPublished - 2016
Event13th International Workshop on Nanomechanical Sensing - Delft, Netherlands
Duration: 22 Jun 201624 Jun 2016

Workshop

Workshop13th International Workshop on Nanomechanical Sensing
Abbreviated titleNMC 2016
CountryNetherlands
CityDelft
Period22/06/1624/06/16

Cite this

Tamer, S., Sadeghian Marnani, H., Keyvani Janbahan, S., Goosen, H., & van Keulen, F. (2016). Quantitative measurement of tip-sample interaction forces in tapping mode atomic force microscopy. 199-200. Abstract from 13th International Workshop on Nanomechanical Sensing, Delft, Netherlands.