Quantitative roughness measurements with iTIRM.

RM van der Bijl, OW Fähnle, H van Brug, JJM Braat

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Optical Fabrication and Testing
Editors	A Lindquist
Pages	130-132
Number of pages	3
Publication status	Published - 2000

OSA Technical Digest series

Keywords

@inproceedings{3cd19feadedb47698c68cd3b02623cee,

title = "Quantitative roughness measurements with iTIRM.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van der Bijl}, RM and OW F{\"a}hnle and {van Brug}, H and JJM Braat",

note = "OSA Technical Digest series",

year = "2000",

language = "Undefined/Unknown",

pages = "130--132",

editor = "A Lindquist",

booktitle = "Optical Fabrication and Testing",

}