Quantitative roughness measurements with iTIRM.

RM van der Bijl, OW Fähnle, H van Brug, JJM Braat

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationOptical Fabrication and Testing
EditorsA Lindquist
Number of pages3
Publication statusPublished - 2000

Bibliographical note

OSA Technical Digest series


  • ZX Int.klas.verslagjaar < 2002

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