Quantitative surface characterization using a Normarki microscope.

OW Fähnle, S Debruyne, T Wons, RM van der Bijl, H van Brug, JJM Braat

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Optical Fabrication and Testing
Editors	K Tatsuno
Pages	91-93
Number of pages	3
Publication status	Published - 2000

ODF2000; OSA Technical Digest series

Keywords

@inproceedings{d10fc484af454288ab0dc69d11f37e8f,

title = "Quantitative surface characterization using a Normarki microscope.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "OW F{\"a}hnle and S Debruyne and T Wons and {van der Bijl}, RM and {van Brug}, H and JJM Braat",

note = "ODF2000; OSA Technical Digest series",

year = "2000",

language = "Undefined/Unknown",

pages = "91--93",

editor = "K Tatsuno",

booktitle = "Optical Fabrication and Testing",

}

TY - GEN

T1 - Quantitative surface characterization using a Normarki microscope.

AU - Fähnle, OW

AU - Debruyne, S

AU - Wons, T

AU - van der Bijl, RM

AU - van Brug, H

AU - Braat, JJM

N1 - ODF2000; OSA Technical Digest series

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SP - 91

EP - 93

BT - Optical Fabrication and Testing

A2 - Tatsuno, K

ER -