Radical transport in deep silicon structures during dry etching.

MA Blauw, T Zijlstra, EWJM van der Drift

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationWorkshop on Semiconductor Sensor and Actuator Technology (Sesens)
EditorsJP Veen
Pages617-622
Number of pages6
Publication statusPublished - 2000

Bibliographical note

CD-Rom

Keywords

  • ZX Int.klas.verslagjaar < 2002

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