Raman spectroscopy characterization of residual stress in multicrystalline silicon solar wafers and solar cells: relation to microstructure, defects and processing conditions

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 37th IEEE Photovoltaic Specialists Conference
EditorsD Wilt
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1668-1673
Number of pages6
DOIs
Publication statusPublished - 2011
Event37th IEEE Photovoltaic Specialists Conference - Seattle, United States
Duration: 19 Jun 201124 Jun 2011
Conference number: 37

Publication series

Name
PublisherIEEE

Conference

Conference37th IEEE Photovoltaic Specialists Conference
Abbreviated titlePVSC 2011
CountryUnited States
City Seattle
Period19/06/1124/06/11

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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