Re-scan confocal microscopy (RCM) improves the resolution of confocal microscopy and increases the sensitivity

Giulia De Luca, Ronald Breedijk, Ron Hoebe, Sjoerd Stallinga, Erik Manders

    Research output: Contribution to journalArticleScientificpeer-review

    11 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1-11
    JournalMethods and Applications in Fluorescence
    Volume5
    Issue number1
    DOIs
    Publication statusPublished - Mar 2017

    Keywords

    • confocal microscopy
    • super-resolution microscopy
    • high sensitive microscopy
    • scanning microscopy
    • three-dimensional microscopy

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