Real time displacement measurement using a multicamera phase stepping interferometer

AJP van Haasteren, HJ Frankena

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Original languageUndefined/Unknown
Title of host publicationElectronic Speckle Pattern Interferometry; Principles and practice
EditorsP Meinlschmidt, KD Hinsch, RS Sirohi
Number of pages6
Publication statusPublished - 1996

Bibliographical note

The International Society for Optical Engineering (SPIE), Washington

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