Recent Developments in Orientation Contrast Microscopy

Hadi Pirgazi*, Roumen H. Petrov, Loïc Malet, Stéphane Godet, Leo A.I. Kestens

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeEntry for encyclopedia/dictionaryScientific


Automated mapping of crystallographic orientations based on the diffraction of electrons has been widely employed to characterize the microstructure of crystalline materials. The most commonly used technique in this field is Electron Backscatter Diffraction (EBSD), which is a scanning electron microscopy based technique. Modern EBSD owes its popularity to the fact that it offers a reasonable balance between spatial resolution (30–50 nm) and field width (~mm2). This article highlights a number of new developments and applications of orientation contrast microscopy including (1) 3D-EBSD, (2) Transmission Kikuchi Diffraction (TKD) and (3) ACOM-TEM (Automatic Crystal Orientation Mapping in the TEM)
Original languageEnglish
Title of host publicationEncyclopedia of Materials
Subtitle of host publicationMetals and Alloys
ISBN (Electronic)9780128197264
ISBN (Print)9780128197332
Publication statusPublished - 2021


  • Electron diffraction
  • Transmission Kikuchi diffraction (TKD
  • Focused ion beam tomography
  • 3D microstructure Serial sectioning )
  • Three-dimensional Electron Back Scattering Diffraction (3D-EBSD)
  • Orientation contrast microscopy


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