Recent Trends and Perspectives on Defect-Oriented Testing

P. Bernardi; R. Cantoro; A. Coyette; W. Dobbeleare; M. Fieback; A. Floridia; G. Gielenk; A. M. Guerriero; S. Hamdioui; null More Authors

doi:10.1109/IOLTS56730.2022.9897647

Recent Trends and Perspectives on Defect-Oriented Testing

P. Bernardi, R. Cantoro, A. Coyette^*, W. Dobbeleare, M. Fieback, A. Floridia, G. Gielenk, A. M. Guerriero, S. Hamdioui, More Authors

^*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Abstract

Electronics employed in modern safety-critical systems require severe qualification during the manufacturing process and in the field, to prevent fault effects from manifesting themselves as critical failures during mission operations. Traditional fault models are not sufficient anymore to guarantee the required quality levels for chips utilized in mission-critical applications. The research community and industry have been investigating new test approaches such as device-aware test, cell-aware test, path-delay test, and even test methodologies based on the analysis of manufacturing data to move the scope from OPPM to OPPB. This special session presents four contributions, from academic researchers and industry professionals, to enable better chip quality. We present results on various activities towards this objective, including device-aware test, software-based self-test, and memory test.

Original language	English
Title of host publication	Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
Editors	Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Number of pages	10
ISBN (Electronic)	9781665473552
DOIs	https://doi.org/10.1109/IOLTS56730.2022.9897647
Publication status	Published - 2022
Event	28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022 - Torino, Italy Duration: 12 Sep 2022 → 14 Sep 2022

Publication series

Name	Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022

Conference

Conference	28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
Country/Territory	Italy
City	Torino
Period	12/09/22 → 14/09/22

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

cell-aware test
data analytics
device-aware test
DPPB
DPPM
emerging technologies
Flash
non-volatile memories
visual inspection

Access to Document

10.1109/IOLTS56730.2022.9897647

Cite this

Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielenk, G., Guerriero, A. M., Hamdioui, S., & More Authors (2022). Recent Trends and Perspectives on Defect-Oriented Testing. In A. Savino, P. Rech, S. Di Carlo, & D. Gizopoulos (Eds.), Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022 (Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/IOLTS56730.2022.9897647

Bernardi, P. ; Cantoro, R. ; Coyette, A. ; Dobbeleare, W. ; Fieback, M. ; Floridia, A. ; Gielenk, G. ; Guerriero, A. M. ; Hamdioui, S. ; More Authors. / Recent Trends and Perspectives on Defect-Oriented Testing. Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. editor / Alessandro Savino ; Paolo Rech ; Stefano Di Carlo ; Dimitris Gizopoulos. Institute of Electrical and Electronics Engineers (IEEE), 2022. (Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022).

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abstract = "Electronics employed in modern safety-critical systems require severe qualification during the manufacturing process and in the field, to prevent fault effects from manifesting themselves as critical failures during mission operations. Traditional fault models are not sufficient anymore to guarantee the required quality levels for chips utilized in mission-critical applications. The research community and industry have been investigating new test approaches such as device-aware test, cell-aware test, path-delay test, and even test methodologies based on the analysis of manufacturing data to move the scope from OPPM to OPPB. This special session presents four contributions, from academic researchers and industry professionals, to enable better chip quality. We present results on various activities towards this objective, including device-aware test, software-based self-test, and memory test.",

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note = "Green Open Access added to TU Delft Institutional Repository {\textquoteleft}You share, we take care!{\textquoteright} – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. ; 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022 ; Conference date: 12-09-2022 Through 14-09-2022",

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Bernardi, P, Cantoro, R, Coyette, A, Dobbeleare, W, Fieback, M, Floridia, A, Gielenk, G, Guerriero, AM, Hamdioui, S & More Authors 2022, Recent Trends and Perspectives on Defect-Oriented Testing. in A Savino, P Rech, S Di Carlo & D Gizopoulos (eds), Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Institute of Electrical and Electronics Engineers (IEEE), 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, 12/09/22. https://doi.org/10.1109/IOLTS56730.2022.9897647

Recent Trends and Perspectives on Defect-Oriented Testing. / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielenk, G.; Guerriero, A. M.; Hamdioui, S.; More Authors.

Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. ed. / Alessandro Savino; Paolo Rech; Stefano Di Carlo; Dimitris Gizopoulos. Institute of Electrical and Electronics Engineers (IEEE), 2022. (Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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AU - Guerriero, A. M.

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Bernardi P, Cantoro R, Coyette A, Dobbeleare W, Fieback M, Floridia A et al. Recent Trends and Perspectives on Defect-Oriented Testing. In Savino A, Rech P, Di Carlo S, Gizopoulos D, editors, Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. Institute of Electrical and Electronics Engineers (IEEE). 2022. (Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022). https://doi.org/10.1109/IOLTS56730.2022.9897647

Recent Trends and Perspectives on Defect-Oriented Testing

Abstract

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Keywords

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