Reconstructing requirements coverage views from design and test using traceability recovery via LSI

M Lormans, A van Deursen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

32 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of TEFSE'05, the 3rd International workshop on traceability in emerging forms of software engineering
Editors s.n.
Place of PublicationNew York (NY), USA
PublisherAssociation for Computing Machinery (ACM)
Pages1-6
Number of pages6
Publication statusPublished - 2005
EventTEFSE'05, 3rd International Workshop on Traceability in Emerging Forms of Software Engineering; ong Beach (CA), USA - New York (NY), USA
Duration: 8 Nov 20058 Nov 2005

Publication series

Name
PublisherACM

Conference

ConferenceTEFSE'05, 3rd International Workshop on Traceability in Emerging Forms of Software Engineering; ong Beach (CA), USA
Period8/11/058/11/05

Bibliographical note

Editors & ISBN onbekend, WPM

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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