Reflection Ptychography via Auto Differentiation on a High Harmonic EUV beamline

Sven Weerdenburg*, Yifeng Shao, Jacob Seifert, Roland Horsten, Wim Coene

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

We demonstrate our beamline using a table-top HHG EUV source for lensless imaging application in reflection m ode. T he s ample r eflection fu nction is reconstructed using an auto-differentiation based ptychographic algorithm built on TensorFlow platform.

Original languageEnglish
Title of host publicationCompact EUV and X-ray Light Sources, EUVXRAY 2022
PublisherOptica Publishing Group (formerly OSA)
Number of pages2
ISBN (Electronic)978-195717106-7
Publication statusPublished - 2022
EventCompact EUV and X-ray Light Sources, EUVXRAY 2022 - Budapest, Hungary
Duration: 21 Mar 202225 Mar 2022

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceCompact EUV and X-ray Light Sources, EUVXRAY 2022
Country/TerritoryHungary
CityBudapest
Period21/03/2225/03/22

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