Relevant modelling and comparison of geometric distortions in watermarking systems

D Delannay, I Setyawan, RL Lagendijk, B Macq

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Application of Digital Image Processing XXV
Editors	E Delp, P Wong
Place of Publication	Bellingham, USA
Publisher	The Optical Society for Optical Engineering
Pages	1-11
Number of pages	11
ISBN (Print)	0-8194-4557-6
Publication status	Published - 2002

Name
Publisher	The Optical Society for Optical Engineering

Name	Proceedings of SPIE- International Society for Optical Engineering
Volume	4790
ISSN (Print)	0277-786X

Keywords

@inproceedings{5285c56310c245a0a1a0766f550a023f,

title = "Relevant modelling and comparison of geometric distortions in watermarking systems",

keywords = "Wiskunde en Informatica, Techniek, technische Wiskunde en Informatica, conference contrib. refereed, Conf.proc. > 3 pag",

author = "D Delannay and I Setyawan and RL Lagendijk and B Macq",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-8194-4557-6",

publisher = "The Optical Society for Optical Engineering",

pages = "1--11",

editor = "E Delp and P Wong",

booktitle = "Application of Digital Image Processing XXV",

}

Relevant modelling and comparison of geometric distortions in watermarking systems. / Delannay, D; Setyawan, I; Lagendijk, RL et al.
Application of Digital Image Processing XXV. ed. / E Delp; P Wong. Bellingham, USA: The Optical Society for Optical Engineering, 2002. p. 1-11 (Proceedings of SPIE- International Society for Optical Engineering; Vol. 4790).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Relevant modelling and comparison of geometric distortions in watermarking systems

AU - Delannay, D

AU - Setyawan, I

AU - Lagendijk, RL

AU - Macq, B

PY - 2002

Y1 - 2002

KW - Wiskunde en Informatica

KW - Techniek

KW - technische Wiskunde en Informatica

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-8194-4557-6

SP - 1

EP - 11

BT - Application of Digital Image Processing XXV

A2 - Delp, E

A2 - Wong, P

PB - The Optical Society for Optical Engineering

CY - Bellingham, USA

ER -