Abstract
SRAM Physical Unclonable Functions (PUFs) are among other things today commercially used for secure primitives such as key generation and authentication. The quality of the PUFs and hence the security primitives, depends on intrinsic variations which are technology dependent. Therefore, to sustain the commercial usage of PUFs for cutting-edge technologies, it is important to properly model and evaluate their reliability. In this work, we evaluate the SRAM PUF reliability using within class Hamming distance (WCHD) for 16nm, 14nm, and 7nm using simulations and silicon validation for both low-power and high-performance designs. The results show that our simulation models and expectations match with the silicon measurements. From the experiments, we conclude the following: (1) SRAM PUF is reliable in advanced FinFET technology nodes, i.e., the noise is low in 16nm, 14nm, and 7nm, (2) temperature variations have a marginal impact on the reliability, and (3) both low-power and high-performance SRAMs can be used as a PUF without excessive need of error correcting codes (ECCs).
Original language | English |
---|---|
Title of host publication | Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
Publisher | IEEE |
Pages | 1189-1192 |
Number of pages | 4 |
ISBN (Electronic) | 978-3-9819263-6-1 |
ISBN (Print) | 978-1-6654-9637-7 |
DOIs | |
Publication status | Published - 2022 |
Event | 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE 2022) - Virtual at Antwerp, Belgium Duration: 14 Mar 2022 → 23 Mar 2022 |
Conference
Conference | 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE 2022) |
---|---|
Abbreviated title | DATE 2022 |
Country/Territory | Belgium |
City | Virtual at Antwerp |
Period | 14/03/22 → 23/03/22 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Keywords
- FinFET
- measurements
- reliability
- simulation model
- SRAM PUF