Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes

Shayesteh Masoumian, Georgios Selimis, Rui Wang, Geert-Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

20 Downloads (Pure)

Abstract

SRAM Physical Unclonable Functions (PUFs) are among other things today commercially used for secure primitives such as key generation and authentication. The quality of the PUFs and hence the security primitives, depends on intrinsic variations which are technology dependent. Therefore, to sustain the commercial usage of PUFs for cutting-edge technologies, it is important to properly model and evaluate their reliability. In this work, we evaluate the SRAM PUF reliability using within class Hamming distance (WCHD) for 16nm, 14nm, and 7nm using simulations and silicon validation for both low-power and high-performance designs. The results show that our simulation models and expectations match with the silicon measurements. From the experiments, we conclude the following: (1) SRAM PUF is reliable in advanced FinFET technology nodes, i.e., the noise is low in 16nm, 14nm, and 7nm, (2) temperature variations have a marginal impact on the reliability, and (3) both low-power and high-performance SRAMs can be used as a PUF without excessive need of error correcting codes (ECCs).
Original languageEnglish
Title of host publicationProceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
PublisherIEEE
Pages1189-1192
Number of pages4
ISBN (Electronic)978-3-9819263-6-1
ISBN (Print)978-1-6654-9637-7
DOIs
Publication statusPublished - 2022
Event2022 Design, Automation & Test in Europe
Conference & Exhibition (DATE 2022)
- Virtual at Antwerp, Belgium
Duration: 14 Mar 202223 Mar 2022

Conference

Conference2022 Design, Automation & Test in Europe
Conference & Exhibition (DATE 2022)
Abbreviated titleDATE 2022
Country/TerritoryBelgium
CityVirtual at Antwerp
Period14/03/2223/03/22

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • FinFET
  • measurements
  • reliability
  • simulation model
  • SRAM PUF

Fingerprint

Dive into the research topics of 'Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes'. Together they form a unique fingerprint.

Cite this