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Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes
Shayesteh Masoumian, Georgios Selimis, Rui Wang, Geert-Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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