Reliability analysis of single grain Si TFT using 2D simulation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Thin film transistors 9 (TFT 9)
Editors	Y Kuo
Place of Publication	s.l.
Publisher	s.n.
Pages	109-114
Number of pages	6
ISBN (Print)	978-1-56677-655-4
Publication status	Published - 2008
Event	214th ECS meeting, Honolulu HI, USA - s.l. Duration: 12 Oct 2008 → 17 Oct 2008

Name
Publisher	s.n.

Conference	214th ECS meeting, Honolulu HI, USA
Period	12/10/08 → 17/10/08

Keywords

@inproceedings{1a4ba3d52de94e4fbbd462c66ed9703a,

title = "Reliability analysis of single grain Si TFT using 2D simulation",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "A Baiano and J Tan and R Ishihara and CIM Beenakker",

year = "2008",

language = "Undefined/Unknown",

isbn = "978-1-56677-655-4",

publisher = "s.n.",

pages = "109--114",

editor = "Y Kuo",

booktitle = "Thin film transistors 9 (TFT 9)",

note = "214th ECS meeting, Honolulu HI, USA ; Conference date: 12-10-2008 Through 17-10-2008",

}

TY - GEN

T1 - Reliability analysis of single grain Si TFT using 2D simulation

AU - Baiano, A

AU - Tan, J

AU - Ishihara, R

AU - Beenakker, CIM

PY - 2008

Y1 - 2008

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-56677-655-4

SP - 109

EP - 114

BT - Thin film transistors 9 (TFT 9)

A2 - Kuo, Y

PB - s.n.

CY - s.l.

T2 - 214th ECS meeting, Honolulu HI, USA

Y2 - 12 October 2008 through 17 October 2008

ER -