Lumen depreciation is one of the major failure modes in light-emitting diode (LED) systems. It originates from the degradation of the different components within the system, including the chip, the driver, and the optical materials (i.e., phosphorous layer). The kinetics of degradation in real-life applications is relatively slow, and in most cases, it takes several years to see an obvious deterioration of optical properties. A highly accelerated stress testing (HAST) setup and a methodology to extrapolate the results to real applications are therefore needed to test the reliability of LED package and lens materials. Employing HAST concept in LED industry is inevitable due to the necessity of assessing the reliability of new products in a short period of time. This chapter aims at briefly explaining the degradation mechanism of optical components in LED package and how they contribute to the lumen depreciation of the LED package. The concept of HAST and the way the reliability of LED packages can be assessed will also be explained.
|Title of host publication||Solid State Lighting Reliability Part 2|
|Subtitle of host publication||Components to Systems|
|Editors||Willem Dirk van Driel, Xuejun Fan, Guo Qi Zhang|
|Place of Publication||Cham|
|Number of pages||25|
|Publication status||Published - 2018|
|Name||Solid State Lighting Technology and Application Series|
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- Blue light exposure
- Stress testing