Reliability Assessment of Light-Emitting Diode Packages with Both Luminous Flux Response Surface Model and Spectral Power Distribution Method

Wei Chen, Jiajie Fan*, Cheng Qian, Bin Pu, Xuejun Fan, Guo Qi Zhang

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

16 Citations (Scopus)
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