Reliability estimation for populations with limited and heavily censored failure information

LA Chmura, PHF Morshuis, E Gulski, JJ Smit, A Janssen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 2013 IEEE Electrical Insulation Conference
EditorsE David
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages159-163
Number of pages5
ISBN (Print)978-1-4673-4744-0
DOIs
Publication statusPublished - 2013
EventEIC 2013, Ottawa, Canada - Piscataway, NJ, USA
Duration: 2 Jun 20135 Jun 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceEIC 2013, Ottawa, Canada
Period2/06/135/06/13

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