Reliability of (100) and (110) oriented single grain Si TFT's without seed substrate

T Chen; R Ishihara; CIM Beenakker

doi:10.1109/IRPS.2010.5488807

Reliability of (100) and (110) oriented single grain Si TFT's without seed substrate

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings 2010 IEEE international Reliability Physics Symposium
Editors	T Moore
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	342-346
Number of pages	5
ISBN (Print)	978-1-4244-5431-0
DOIs	https://doi.org/10.1109/IRPS.2010.5488807
Publication status	Published - 2010
Event	2010 IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, USA - Piscataway, NJ, USA Duration: 2 May 2010 → 6 May 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	2010 IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, USA
Period	2/05/10 → 6/05/10

Keywords

Conf.proc. > 3 pag

Access to Document

10.1109/IRPS.2010.5488807

Cite this

@inproceedings{448990a056944d34b5cbd916e23d8e44,

title = "Reliability of (100) and (110) oriented single grain Si TFT's without seed substrate",

keywords = "Conf.proc. > 3 pag",

author = "T Chen and R Ishihara and CIM Beenakker",

year = "2010",

doi = "10.1109/IRPS.2010.5488807",

language = "English",

isbn = "978-1-4244-5431-0",

publisher = "IEEE",

pages = "342--346",

editor = "T Moore",

booktitle = "Proceedings 2010 IEEE international Reliability Physics Symposium",

address = "United States",

note = "2010 IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, USA ; Conference date: 02-05-2010 Through 06-05-2010",

}

Chen, T, Ishihara, R & Beenakker, CIM 2010, Reliability of (100) and (110) oriented single grain Si TFT's without seed substrate. in T Moore (ed.), Proceedings 2010 IEEE international Reliability Physics Symposium. IEEE, Piscataway, NJ, USA, pp. 342-346, 2010 IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, USA, 2/05/10. https://doi.org/10.1109/IRPS.2010.5488807

Reliability of (100) and (110) oriented single grain Si TFT's without seed substrate. / Chen, T; Ishihara, R ; Beenakker, CIM.
Proceedings 2010 IEEE international Reliability Physics Symposium. ed. / T Moore. Piscataway, NJ, USA: IEEE, 2010. p. 342-346.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Reliability of (100) and (110) oriented single grain Si TFT's without seed substrate

AU - Chen, T

AU - Ishihara, R

AU - Beenakker, CIM

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

U2 - 10.1109/IRPS.2010.5488807

DO - 10.1109/IRPS.2010.5488807

M3 - Conference contribution

SN - 978-1-4244-5431-0

SP - 342

EP - 346

BT - Proceedings 2010 IEEE international Reliability Physics Symposium

A2 - Moore, T

PB - IEEE

CY - Piscataway, NJ, USA

T2 - 2010 IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, USA

Y2 - 2 May 2010 through 6 May 2010

ER -