Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain

V Rana, R Ishihara, JW Metselaar, CIM Beenakker, Y Hiroshima, D Abe, S Inoue, T Shimoda

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

566 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationSID'04; Society for information display 2004 international symposium
Place of PublicationSan Jose, CA. USA
PublisherSociety for Information Display
Pages1-4
Number of pages4
ISBN (Print)0004-966X
Publication statusPublished - 2004
EventSociety for information display international symposium, Seattle, USA - San Jose, CA. USA
Duration: 25 May 200425 May 2004

Publication series

Name
PublisherSociety for Information Display
Name
Volume35

Conference

ConferenceSociety for information display international symposium, Seattle, USA
Period25/05/0425/05/04

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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