Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain

V Rana; R Ishihara; JW Metselaar; CIM Beenakker; Y Hiroshima; D Abe; S Inoue; T Shimoda

Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain

V Rana, R Ishihara, JW Metselaar, CIM Beenakker, Y Hiroshima, D Abe, S Inoue, T Shimoda

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

747 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	SID'04; Society for information display 2004 international symposium
Place of Publication	San Jose, CA. USA
Publisher	Society for Information Display
Pages	1-4
Number of pages	4
ISBN (Print)	0004-966X
Publication status	Published - 2004
Event	Society for information display international symposium, Seattle, USA - San Jose, CA. USA Duration: 25 May 2004 → 25 May 2004

Publication series

Name
Publisher	Society for Information Display

Name
Volume	35

Conference

Conference	Society for information display international symposium, Seattle, USA
Period	25/05/04 → 25/05/04

Bibliographical note

ed. is niet bekend

Keywords

Elektrotechniek
Techniek
Conf.proc. > 3 pag

Cite this

@inproceedings{a069bc2de75b432c845ccb54f8c7affa,

title = "Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain",

keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",

author = "V Rana and R Ishihara and JW Metselaar and CIM Beenakker and Y Hiroshima and D Abe and S Inoue and T Shimoda",

note = "ed. is niet bekend; Society for information display international symposium, Seattle, USA ; Conference date: 25-05-2004 Through 25-05-2004",

year = "2004",

language = "Undefined/Unknown",

isbn = "0004-966X",

publisher = "Society for Information Display",

pages = "1--4",

booktitle = "SID'04; Society for information display 2004 international symposium",

address = "United States",

}

Rana, V, Ishihara, R, Metselaar, JW, Beenakker, CIM, Hiroshima, Y, Abe, D, Inoue, S & Shimoda, T 2004, Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain. in SID'04; Society for information display 2004 international symposium. Society for Information Display, San Jose, CA. USA, pp. 1-4, Society for information display international symposium, Seattle, USA, 25/05/04.

Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain. / Rana, V; Ishihara, R; Metselaar, JW et al.
SID'04; Society for information display 2004 international symposium. San Jose, CA. USA: Society for Information Display, 2004. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Reliability of single-crystalline Si TFTs fabricated inside a location-controlled grain

AU - Rana, V

AU - Ishihara, R

AU - Metselaar, JW

AU - Beenakker, CIM

AU - Hiroshima, Y

AU - Abe, D

AU - Inoue, S

AU - Shimoda, T

N1 - ed. is niet bekend

PY - 2004

Y1 - 2004

KW - Elektrotechniek

KW - Techniek

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0004-966X

SP - 1

EP - 4

BT - SID'04; Society for information display 2004 international symposium

PB - Society for Information Display

CY - San Jose, CA. USA

T2 - Society for information display international symposium, Seattle, USA

Y2 - 25 May 2004 through 25 May 2004

ER -