Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon

J Zhang; R Ishihara; H Takagishi; R Kawajiri; T Shimoda; CIM Beenakker

Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon

J Zhang, R Ishihara, H Takagishi, R Kawajiri, T Shimoda, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012)
Editors	M Furuta et al.
Place of Publication	Chiba, Japan
Publisher	Japan Society of Applied Physics
Pages	309-312
Number of pages	4
ISBN (Print)	978-1-4673-0399-6
Publication status	Published - 2012
Event	19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012), Kyoto, Japan - Chiba Duration: 4 Jul 2012 → 6 Jul 2012

Publication series

Name
Publisher	Japan Society of Applied Physics

Conference

Conference	19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012), Kyoto, Japan
Period	4/07/12 → 6/07/12

Bibliographical note

Harvest
Article number: 6294913

Cite this

Zhang, J., Ishihara, R., Takagishi, H., Kawajiri, R., Shimoda, T., & Beenakker, CIM. (2012). Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon. In M. Furuta et al. (Ed.), Proceedings of the 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012) (pp. 309-312). Japan Society of Applied Physics.

Zhang, J ; Ishihara, R ; Takagishi, H et al. / Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon. Proceedings of the 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012). editor / M Furuta et al. Chiba, Japan : Japan Society of Applied Physics, 2012. pp. 309-312

@inproceedings{338eaacdfa16470e84926f0cae58b2f2,

title = "Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon",

author = "J Zhang and R Ishihara and H Takagishi and R Kawajiri and T Shimoda and CIM Beenakker",

note = "Harvest Article number: 6294913; 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012), Kyoto, Japan ; Conference date: 04-07-2012 Through 06-07-2012",

year = "2012",

language = "English",

isbn = "978-1-4673-0399-6",

publisher = "Japan Society of Applied Physics",

pages = "309--312",

editor = "{Furuta et al.}, M",

booktitle = "Proceedings of the 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012)",

address = "Japan",

}

Zhang, J, Ishihara, R, Takagishi, H, Kawajiri, R, Shimoda, T & Beenakker, CIM 2012, Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon. in M Furuta et al. (ed.), Proceedings of the 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012). Japan Society of Applied Physics, Chiba, Japan, pp. 309-312, 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012), Kyoto, Japan, 4/07/12.

Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon. / Zhang, J; Ishihara, R; Takagishi, H et al.
Proceedings of the 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012). ed. / M Furuta et al. Chiba, Japan: Japan Society of Applied Physics, 2012. p. 309-312.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon

AU - Zhang, J

AU - Ishihara, R

AU - Takagishi, H

AU - Kawajiri, R

AU - Shimoda, T

AU - Beenakker, CIM

N1 - Harvest Article number: 6294913

PY - 2012

Y1 - 2012

UR - http://www.scopus.com/record/display.url?eid=2-s2.0-84867902864&origin=inward&txGid=BU4dpTNR8tgVqT0oKb_LdJq%3a8#

M3 - Conference contribution

SN - 978-1-4673-0399-6

SP - 309

EP - 312

BT - Proceedings of the 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012)

A2 - Furuta et al., M

PB - Japan Society of Applied Physics

CY - Chiba, Japan

T2 - 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012), Kyoto, Japan

Y2 - 4 July 2012 through 6 July 2012

ER -

Zhang J, Ishihara R, Takagishi H, Kawajiri R, Shimoda T, Beenakker CIM. Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon. In Furuta et al. M, editor, Proceedings of the 19th international workshop on active-matrix flatpanel displays and devices - TFT Technologies and FPD Materials, (AM-FPD 2012). Chiba, Japan: Japan Society of Applied Physics. 2012. p. 309-312

Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon

Publication series

Conference

Bibliographical note

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Cite this