Reliability study of RTV 566 for its application as a ¿Spring¿

AK Dokania, P Kruit

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	229-233
Number of pages	5
Journal	IEEE Transactions on Device and Materials Reliability
Volume	8
Issue number	1
Publication status	Published - 2008

Keywords

@article{5004630c2a5a44a4a093e2acc20c571c,

title = "Reliability study of RTV 566 for its application as a ¿Spring¿",

keywords = "CWTS 0.75 <= JFIS < 2.00",

author = "AK Dokania and P Kruit",

year = "2008",

language = "Undefined/Unknown",

volume = "8",

pages = "229--233",

journal = "IEEE Transactions on Device and Materials Reliability",

issn = "1530-4388",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

number = "1",

}