Reliability study of RTV 566 for its application as a ¿Spring¿

AK Dokania, P Kruit

    Research output: Contribution to journalArticleScientificpeer-review

    2 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)229-233
    Number of pages5
    JournalIEEE Transactions on Device and Materials Reliability
    Volume8
    Issue number1
    Publication statusPublished - 2008

    Keywords

    • CWTS 0.75 <= JFIS < 2.00

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