Reliability testing of in vivo 1H-MRS-signals and elimination of signal artifacts by median filtering

J Slotboom, D van Ormondt

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 19th Annual Workshop on Circuits, Systems and Signal Processing
Editors	s.n.
Place of Publication	Utrecht
Publisher	STW
Pages	372-377
Number of pages	6
ISBN (Print)	90-73461-56-7
Publication status	Published - 2008
Event	PRORISC, Veldhoven, The Netherlands - The Netherlands Duration: 27 Nov 2008 → 28 Nov 2008

Name
Publisher	STW

Conference	PRORISC, Veldhoven, The Netherlands
Period	27/11/08 → 28/11/08

Keywords

@inproceedings{730f3b187b9d4498931c2c22add7b231,

title = "Reliability testing of in vivo 1H-MRS-signals and elimination of signal artifacts by median filtering",

keywords = "Conf.proc. > 3 pag",

author = "J Slotboom and {van Ormondt}, D",

year = "2008",

language = "Undefined/Unknown",

isbn = "90-73461-56-7",

publisher = "STW",

pages = "372--377",

editor = "s.n.",

booktitle = "Proceedings of the 19th Annual Workshop on Circuits, Systems and Signal Processing",

note = "PRORISC, Veldhoven, The Netherlands ; Conference date: 27-11-2008 Through 28-11-2008",

}

Reliability testing of in vivo 1H-MRS-signals and elimination of signal artifacts by median filtering. / Slotboom, J; van Ormondt, D.
Proceedings of the 19th Annual Workshop on Circuits, Systems and Signal Processing. ed. / s.n. Utrecht: STW, 2008. p. 372-377.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Reliability testing of in vivo 1H-MRS-signals and elimination of signal artifacts by median filtering

AU - Slotboom, J

AU - van Ormondt, D

PY - 2008

Y1 - 2008

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 90-73461-56-7

SP - 372

EP - 377

BT - Proceedings of the 19th Annual Workshop on Circuits, Systems and Signal Processing

A2 - s.n., null

PB - STW

CY - Utrecht

T2 - PRORISC, Veldhoven, The Netherlands

Y2 - 27 November 2008 through 28 November 2008

ER -