Abstract
In this chapter, the past and present situations of the reliability domain are discussed. As of today, most industries are in the transfer from test-to-pass approaches to more advanced strategies. These strategies currently are to determine the reliability capability by applying (where possible) the test-to-failure concept, extending reliability qualification conformance tests beyond the required levels, and assessing any physical or electrical degradation of a product during those tests. New concepts are under investigation that focus on the physics of degradation. Progress in the area of reliability will never stop so as to reduce the amount (and cost) of product field failures.
| Original language | English |
|---|---|
| Title of host publication | Recent Advances in Microelectronics Reliability |
| Subtitle of host publication | Contributions from the European ECSEL JU Project iRel40 |
| Publisher | Springer |
| Pages | 1-8 |
| Number of pages | 8 |
| ISBN (Electronic) | 9783031593611 |
| ISBN (Print) | 9783031593604 |
| DOIs | |
| Publication status | Published - 2024 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.