Repeat-pass interferometric experiments with the Tandem-X constellation for accurate along-track motion estimation

Pau Prats-Iraola, Marc Rodriguez-Cassola, Nestor Yague-Martinez, Paco Lopez-Dekker, Rolf Scheiber, Francesco De Zan, Thomas Kraus, Steffen Wollstadt

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)

Abstract

This contribution presents two experiments performed with the TerraSAR-X (TSX) and TanDEM-X (TDX) satellites working in the pursuit monostatic configuration. Their objective is to estimate the along-track component of the motion in the scene in repeat-pass scenarios with an accuracy better than the one given by the stripmap azimuth resolution. Such performance is possible by exploiting the angular diversity of the bidirectional (BiDi) SAR mode and the π-shifted (or staggered) TOPS.

Original languageEnglish
Title of host publication2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages4077-4080
Number of pages4
Volume2015-November
ISBN (Electronic)9781479979295
DOIs
Publication statusPublished - 10 Nov 2015
Externally publishedYes
Event2015 IEEE international geoscience and remote sensing symposium, IGARSS 2015, Milan, Italy - Piscataway, NJ, USA, Milan, Italy
Duration: 26 Jul 201531 Jul 2015

Conference

Conference2015 IEEE international geoscience and remote sensing symposium, IGARSS 2015, Milan, Italy
CountryItaly
CityMilan
Period26/07/1531/07/15

Keywords

  • bidirectional SAR
  • coregistration
  • dual-beam
  • SAR interferometry
  • TOPS

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    Prats-Iraola, P., Rodriguez-Cassola, M., Yague-Martinez, N., Lopez-Dekker, P., Scheiber, R., De Zan, F., Kraus, T., & Wollstadt, S. (2015). Repeat-pass interferometric experiments with the Tandem-X constellation for accurate along-track motion estimation. In 2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015 - Proceedings (Vol. 2015-November, pp. 4077-4080). [7326721] Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/IGARSS.2015.7326721