Research Update: Reactively sputtered nanometer-thin ZrN film as a diffusion barrier between Al and boron layers for radiation detector applications

N Golshani, V Mohammadi, H Schellevis, CIM Beenakker, R Ishihara

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)1-9
Number of pages9
JournalAPL Materials (online)
Issue number10 - 100702
Publication statusPublished - 2014

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