Residual and bending stress measurements by X-ray diffraction and synchrotron diffraction analysis in silicon solar cells

V Popovich, NM van der Pers, M Janssen, IJ Bennett, KMB Jansen, J Wright, IM Richardson

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Title of host publicationPhotovoltaic Specialists Conference (PVSC), 2012 38th IEEE
    PublisherIEEE
    Pages442-447
    Number of pages6
    ISBN (Print)0160-8371
    DOIs
    Publication statusPublished - 2012
    EventPVSC 2012: 38th IEEE Photovoltaic Specialists Conference - Austin, TX, United States
    Duration: 3 Jun 20128 Jun 2012
    Conference number: 38

    Conference

    ConferencePVSC 2012
    Abbreviated titleIEEE PVSC 2012
    CountryUnited States
    CityAustin, TX
    Period3/06/128/06/12

    Keywords

    • Conf.proc. > 3 pag

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