Resolution limits in Electron Beam Induced Deposition (EBID).

N Silvis-Cividjian, CW Hagen, P Kruit

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationJaarboek Nederlandse Vereniging voor Microscopie
    Pages184-185
    Number of pages2
    Publication statusPublished - 2000

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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