Reverse biasing and breakdown behavior of PureB diodes

L Qi, KRC Mok, M Aminian, TLM Scholtes, E Charbon, LK Nanver

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publicationExtended abstracts of the 13th International Workshop on Junction Technology
EditorsK Tsutsui, Z Li, I Mizushima
Place of PublicationTokyo, Japan
PublisherJSAP
Pages70-73
Number of pages4
ISBN (Print)978-1-4799-0578-2
DOIs
Publication statusPublished - 2013
EventIWJT 2013, Kyoto, Japan - Tokyo, Japan
Duration: 6 Jun 20137 Jun 2013

Publication series

Name
PublisherJSAP

Conference

ConferenceIWJT 2013, Kyoto, Japan
Period6/06/137/06/13

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