Review of the recent progress on GaN-based vertical power Schottky barrier diodes (SBDs)

Yue Sun, Xuanwu Kang, Yingkui Zheng, Jiang Lu, Xiaoli Tian, Ke Wei, Hao Wu, Wenbo Wang, Xinyu Liu, Guoqi Zhang*

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

59 Citations (Scopus)
125 Downloads (Pure)

Abstract

Gallium nitride (GaN)-based vertical power Schottky barrier diode (SBD) has demonstrated outstanding features in high-frequency and high-power applications. This paper reviews recent progress on GaN-based vertical power SBDs, including the following sections. First, the benchmark for GaN vertical SBDs with different substrates (Si, sapphire, and GaN) are presented. Then, the latest progress in the edge terminal techniques are discussed. Finally, a typical fabrication flow of vertical GaN SBDs is also illustrated briefly.
Original languageEnglish
Article number575
Pages (from-to)1-15
Number of pages15
JournalElectronics (Switzerland)
Volume8
Issue number5
DOIs
Publication statusPublished - 2019

Keywords

  • Edge termination techniques
  • GaN
  • Schottky barrier diode (SBD)
  • Vertical power devices

Fingerprint

Dive into the research topics of 'Review of the recent progress on GaN-based vertical power Schottky barrier diodes (SBDs)'. Together they form a unique fingerprint.

Cite this