Abstract
We present a revised analysis of Negative Capacitance (NC) in ferroelectric-insulator capacitors, and particularly of the difference between systems with and without a metal interlayer. We develop a model accounting for the three-dimensional electrostatics and report analytical and numerical results based on Landau-Ginzburg equations. Our results explain the lack of NC operation in capacitors having an interlayer metal, compare well with recent experiments and enlighten the role of traps at the ferroelectric-oxide interface.
Original language | English |
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Title of host publication | Proceedings of the IEEE International Electron Devices Meeting, IEDM 2019 |
Publisher | IEEE |
Number of pages | 4 |
ISBN (Electronic) | 978-1-7281-4031-5 |
DOIs | |
Publication status | Published - 2019 |
Event | 65th Annual IEEE International Electron Devices Meeting, IEDM 2019 - San Francisco, United States Duration: 7 Dec 2019 → 11 Dec 2019 |
Conference
Conference | 65th Annual IEEE International Electron Devices Meeting, IEDM 2019 |
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Country/Territory | United States |
City | San Francisco |
Period | 7/12/19 → 11/12/19 |