RF-noise modeling in advanced CMOS technologies

GDJ Smit, AJ Scholten, RMT Pijper, LF Tiemeijer, R van der Toorn, D.B.M. Klaassen

Research output: Contribution to journalArticleScientificpeer-review

37 Citations (Scopus)
Original languageEnglish
Pages (from-to)245-254
Number of pages10
JournalIEEE Transactions on Electron Devices
Volume61
Issue number2
DOIs
Publication statusPublished - 2014

Keywords

  • CWTS 0.75 <= JFIS < 2.00

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