RF-noise modeling in advanced CMOS technologies

GDJ Smit, AJ Scholten, RMT Pijper, LF Tiemeijer, R van der Toorn, D.B.M. Klaassen

Research output: Contribution to journal › Article › Scientific › peer-review

41 Citations (Scopus)

Original language	English
Pages (from-to)	245-254
Number of pages	10
Journal	IEEE Transactions on Electron Devices
Volume	61
Issue number	2
DOIs	https://doi.org/10.1109/TED.2013.2282960
Publication status	Published - 2014

Keywords

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title = "RF-noise modeling in advanced CMOS technologies",

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author = "GDJ Smit and AJ Scholten and RMT Pijper and LF Tiemeijer and {van der Toorn}, R and D.B.M. Klaassen",

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AU - Smit, GDJ

AU - Scholten, AJ

AU - Pijper, RMT

AU - Tiemeijer, LF

AU - van der Toorn, R

AU - Klaassen, D.B.M.

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JF - IEEE Transactions on Electron Devices

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