RF small signal avalanche characterization and repercussions on bipolar transistor circuit design: Characterization, modeling and repercussions

V Milovanovic; R van der Toorn; R Pijper

doi:10.1016/j.microrel.2010.10.006

RF small signal avalanche characterization and repercussions on bipolar transistor circuit design: Characterization, modeling and repercussions

V Milovanovic, R van der Toorn, R Pijper

Electronic Components, Technology and Materials

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	1-6
Number of pages	6
Journal	Microelectronics Reliability
DOIs	https://doi.org/10.1016/j.microrel.2010.10.006
Publication status	Published - 2010

Bibliographical note

Online available 13-11-2010

Keywords

CWTS JFIS < 0.75

Access to Document

10.1016/j.microrel.2010.10.006

Cite this

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title = "RF small signal avalanche characterization and repercussions on bipolar transistor circuit design: Characterization, modeling and repercussions",

keywords = "CWTS JFIS < 0.75",

author = "V Milovanovic and {van der Toorn}, R and R Pijper",

note = "Online available 13-11-2010",

year = "2010",

doi = "10.1016/j.microrel.2010.10.006",

language = "English",

pages = "1--6",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

}

TY - JOUR

T1 - RF small signal avalanche characterization and repercussions on bipolar transistor circuit design: Characterization, modeling and repercussions

AU - Milovanovic, V

AU - van der Toorn, R

AU - Pijper, R

N1 - Online available 13-11-2010

PY - 2010

Y1 - 2010

KW - CWTS JFIS < 0.75

U2 - 10.1016/j.microrel.2010.10.006

DO - 10.1016/j.microrel.2010.10.006

M3 - Article

SN - 0026-2714

SP - 1

EP - 6

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -