Rigorous 3D calculation of effects of pit structure in TwoDOS systems.

JAC Veerman, AJH Wachters, AM van der Lee, HP Urbach

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)2075-2097
Number of pages23
JournalOptics Express
Volume15
Issue number5
Publication statusPublished - 2007

Keywords

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Cite this

Veerman, JAC., Wachters, AJH., van der Lee, AM., & Urbach, HP. (2007). Rigorous 3D calculation of effects of pit structure in TwoDOS systems. Optics Express, 15(5), 2075-2097.