Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

S van Haver, JJM Braat, SF Pereira

Research output: Contribution to conference › Poster › Professional

Original language	Undefined/Unknown
Publication status	Published - 2006
Event	two-day symposium "NanoNed and MicroNed" - Eindhoven Duration: 16 Nov 2006 → 17 Nov 2006

Other	two-day symposium "NanoNed and MicroNed"
Period	16/11/06 → 17/11/06

TU Delft

Keywords

@conference{081fe1eb4f2f478f998e4e309b08eff3,

title = "Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.",

keywords = "Geen BTA classificatie",

author = "{van Haver}, S and JJM Braat and SF Pereira",

note = "TU Delft; two-day symposium {"}NanoNed and MicroNed{"} ; Conference date: 16-11-2006 Through 17-11-2006",

year = "2006",

language = "Undefined/Unknown",

}