Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

S van Haver, JJM Braat, SF Pereira

Research output: Contribution to conference › Poster › Professional

Original language	Undefined/Unknown
Publication status	Published - 2006
Event	One-day Symposium "prospects on high resolution Imaging". - Delft Duration: 3 Nov 2006 → 3 Nov 2006

Other	One-day Symposium "prospects on high resolution Imaging".
Period	3/11/06 → 3/11/06

TU Delft

Keywords

@conference{cce2f8a3e64a4b448de5e4c3469f46f4,

title = "Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.",

keywords = "other public output, Geen BTA classificatie",

author = "{van Haver}, S and JJM Braat and SF Pereira",

note = "TU Delft; One-day Symposium {"}prospects on high resolution Imaging{"}. ; Conference date: 03-11-2006 Through 03-11-2006",

year = "2006",

language = "Undefined/Unknown",

}