Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

S van Haver, JJM Braat, SF Pereira

Research output: Contribution to conferencePosterProfessional

Original languageUndefined/Unknown
Publication statusPublished - 2006
EventOne-day Symposium "prospects on high resolution Imaging". - Delft
Duration: 3 Nov 20063 Nov 2006

Other

OtherOne-day Symposium "prospects on high resolution Imaging".
Period3/11/063/11/06

Keywords

  • other public output
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