Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM

Radim Skoupý, Daan B. Boltje, Miroslav Slouf, Kateřina Mrázová, Tomáš Láznička, Clémence M. Taisne, Vladislav Krzyžánek*, Jacob P. Hoogenboom, Arjen J. Jakobi

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

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