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Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM
Radim Skoupý, Daan B. Boltje, Miroslav Slouf, Kateřina Mrázová, Tomáš Láznička, Clémence M. Taisne, Vladislav Krzyžánek*, Jacob P. Hoogenboom, Arjen J. Jakobi
*Corresponding author for this work
Research output: Contribution to journal › Article › Scientific › peer-review
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