Robust UV/VUV/EUV PureB photodiode detector technology with high CMOS Compatibility

LK Nanver, L Qi, V Mohammadi, C Mok Kai Rine, WB De Boer, N Golshani, A Sammak, TLM Scholtes, A Gottwald, U Kroth, F Scholze

Research output: Contribution to journalArticleScientificpeer-review

36 Citations (Scopus)
Original languageEnglish
Pages (from-to)1-11
Number of pages11
JournalIEEE Journal of Selected Topics in Signal Processing
Volume20
Issue number6
DOIs
Publication statusPublished - 2014

Cite this

Nanver, LK., Qi, L., Mohammadi, V., Mok Kai Rine, C., De Boer, WB., Golshani, N., Sammak, A., Scholtes, TLM., Gottwald, A., Kroth, U., & Scholze, F. (2014). Robust UV/VUV/EUV PureB photodiode detector technology with high CMOS Compatibility. IEEE Journal of Selected Topics in Signal Processing, 20(6), 1-11. https://doi.org/10.1109/JSTQE.2014.2319582