Robust wafer-level thin-film encapsulation of Microstructures using low stress PECVD silicon carbide

V Rajaraman, LS Pakula, HTM Pham, PM Sarro, PJ French

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

9 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProc. IEEE MEMS 2009
EditorsPM Sarro, C Hierold
Place of PublicationSorrento, Italy
PublisherIEEE Society
Pages140-143
Number of pages4
ISBN (Print)978-1-4244-2977-6
Publication statusPublished - 2009
EventIEEE MEMS 2009 - Sorrento, Italy
Duration: 25 Jan 200929 Jan 2009

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE MEMS 2009
Period25/01/0929/01/09

Keywords

  • Conf.proc. > 3 pag

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