RTS Noise Characterization in Single Photon Avalanche Diodes

MA Karami, E Charbon

Research output: Contribution to journalArticleScientificpeer-review

17 Citations (Scopus)
Original languageEnglish
Pages (from-to)692-694
Number of pages3
JournalIEEE Electron Device Letters
Volume31
Issue number7
DOIs
Publication statusPublished - 2010

Keywords

  • CWTS JFIS >= 2.00

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