Runtime Testability in Dynamic High-Availability Component-Based Systems

A Gonzalez Sanchez; EAB Piel; HG Gross; AJC van Gemund

Runtime Testability in Dynamic High-Availability Component-Based Systems

A Gonzalez Sanchez, EAB Piel, HG Gross, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle
Editors	A Alimohammad et al
Place of Publication	Los Alamitos, CA, USA
Publisher	IEEE Society
Pages	37-42
Number of pages	6
ISBN (Print)	978-0-7695-4146-4
Publication status	Published - 2010
Event	VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle - Los Alamitos, CA, USA Duration: 22 Aug 2010 → 27 Aug 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle
Period	22/08/10 → 27/08/10

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{2347f8a17e354b00a93e1831dbb7b7fd,

title = "Runtime Testability in Dynamic High-Availability Component-Based Systems",

keywords = "Conf.proc. > 3 pag",

author = "{Gonzalez Sanchez}, A and EAB Piel and HG Gross and {van Gemund}, AJC",

year = "2010",

language = "English",

isbn = "978-0-7695-4146-4",

publisher = "IEEE Society",

pages = "37--42",

editor = "{Alimohammad et al}, A",

booktitle = "VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle",

note = "VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle ; Conference date: 22-08-2010 Through 27-08-2010",

}

Gonzalez Sanchez, A, Piel, EAB, Gross, HG & van Gemund, AJC 2010, Runtime Testability in Dynamic High-Availability Component-Based Systems. in A Alimohammad et al (ed.), VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle. IEEE Society, Los Alamitos, CA, USA, pp. 37-42, VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle, 22/08/10.

Runtime Testability in Dynamic High-Availability Component-Based Systems. / Gonzalez Sanchez, A; Piel, EAB; Gross, HG et al.
VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle. ed. / A Alimohammad et al. Los Alamitos, CA, USA: IEEE Society, 2010. p. 37-42.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Runtime Testability in Dynamic High-Availability Component-Based Systems

AU - Gonzalez Sanchez, A

AU - Piel, EAB

AU - Gross, HG

AU - van Gemund, AJC

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-0-7695-4146-4

SP - 37

EP - 42

BT - VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle

A2 - Alimohammad et al, A

PB - IEEE Society

CY - Los Alamitos, CA, USA

T2 - VALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle

Y2 - 22 August 2010 through 27 August 2010

ER -