Runtime Testability in Dynamic High-Availability Component-Based Systems

A Gonzalez Sanchez, EAB Piel, HG Gross, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publicationVALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle
EditorsA Alimohammad et al
Place of PublicationLos Alamitos, CA, USA
PublisherIEEE Society
Pages37-42
Number of pages6
ISBN (Print)978-0-7695-4146-4
Publication statusPublished - 2010
EventVALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle - Los Alamitos, CA, USA
Duration: 22 Aug 201027 Aug 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceVALID'10: 2nd International Conference on Advances in System Testing and Validation Lifecycle
Period22/08/1027/08/10

Keywords

  • Conf.proc. > 3 pag

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