Sample variability and time stability in scaled silicon nanowires.

M Pierre, X Jehl, R. Wacquez, M. Vinet, M. Sanquer, M. Belli, E. Prati, M. Fanciulli, J Verduijn, GC Tettamanzi, GP Lansbergen, S Rogge, M. Ruoff, M. Fleischer, D. Wharam, D. Kern

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the 10th International Conference on ULtimate Integration of Silicon (ULIS 2009)
    EditorsS Mantl, M Lemme, J Schubert, W Albrecht
    Place of PublicationAachen, Germany
    PublisherIEEE Society
    Pages1-4
    Number of pages4
    Publication statusPublished - 2009
    EventULtimate Integration on Silicon (ULIS) - Aachen, Germany
    Duration: 18 Apr 200920 Apr 2009

    Publication series

    Name
    PublisherIEEE

    Conference

    ConferenceULtimate Integration on Silicon (ULIS)
    Period18/04/0920/04/09

    Keywords

    • Conf.proc. > 3 pag

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