SC interface for capacitive and voltage measurements with extended linear range

VP Iordanov; GCM Meijer; SN Nihtianov

SC interface for capacitive and voltage measurements with extended linear range

VP Iordanov, GCM Meijer, SN Nihtianov

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	ProRISC 2003 Program for research on integrated systems and circuits
Editors	s.n.
Place of Publication	Utrecht
Publisher	Stichting voor de Technische Wetenschappen
Pages	195-201
Number of pages	7
ISBN (Print)	90-73461-39-1
Publication status	Published - 2003
Event	Program for reseach on integrated systems and circuits, Veldhoven, The Netherlands - Utrecht Duration: 25 Nov 2003 → 26 Nov 2003

Publication series

Name
Publisher	Stichting voor de Technische Wetenschappen

Conference

Conference	Program for reseach on integrated systems and circuits, Veldhoven, The Netherlands
Period	25/11/03 → 26/11/03

Bibliographical note

CD-ROM

Keywords

Elektrotechniek
Techniek
Vakpubl., Overig wet. > 3 pag

Cite this

@inproceedings{c3d02daae47a48b9a61391d33c645a68,

title = "SC interface for capacitive and voltage measurements with extended linear range",

keywords = "Elektrotechniek, Techniek, Vakpubl., Overig wet. > 3 pag",

author = "VP Iordanov and GCM Meijer and SN Nihtianov",

note = "CD-ROM; Program for reseach on integrated systems and circuits, Veldhoven, The Netherlands ; Conference date: 25-11-2003 Through 26-11-2003",

year = "2003",

language = "Undefined/Unknown",

isbn = "90-73461-39-1",

publisher = "Stichting voor de Technische Wetenschappen",

pages = "195--201",

editor = "s.n.",

booktitle = "ProRISC 2003 Program for research on integrated systems and circuits",

}

Iordanov, VP, Meijer, GCM & Nihtianov, SN 2003, SC interface for capacitive and voltage measurements with extended linear range. in s.n. (ed.), ProRISC 2003 Program for research on integrated systems and circuits. Stichting voor de Technische Wetenschappen, Utrecht, pp. 195-201, Program for reseach on integrated systems and circuits, Veldhoven, The Netherlands, 25/11/03.

SC interface for capacitive and voltage measurements with extended linear range. / Iordanov, VP; Meijer, GCM; Nihtianov, SN.
ProRISC 2003 Program for research on integrated systems and circuits. ed. / s.n. Utrecht: Stichting voor de Technische Wetenschappen, 2003. p. 195-201.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - SC interface for capacitive and voltage measurements with extended linear range

AU - Iordanov, VP

AU - Meijer, GCM

AU - Nihtianov, SN

N1 - CD-ROM

PY - 2003

Y1 - 2003

KW - Elektrotechniek

KW - Techniek

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SN - 90-73461-39-1

SP - 195

EP - 201

BT - ProRISC 2003 Program for research on integrated systems and circuits

A2 - s.n., null

PB - Stichting voor de Technische Wetenschappen

CY - Utrecht

T2 - Program for reseach on integrated systems and circuits, Veldhoven, The Netherlands

Y2 - 25 November 2003 through 26 November 2003

ER -